Soft Fault Detection in Analog Electronic Circuit Using Three Types of Artificial Neural Network
July 22, 2008 Leave a comment
Analog electronic circuit condition monitoring is gaining importance in electronic industry because of the need to increase product quality and to decrease the possibility of production failure due to faulty electronic component and circuit. Although often the visual inspection of the measured circuit response is adequate to identify the faults, there is a need for a reliable, fast, and automated procedure of diagnostics
The automated diagnosis and detection of faulty electronic circuit can be conducted by an Artificial Neural Network (ANN) [2-8]. The applications of ANN are mainly in the areas of Intelligent Agents, Monitoring and Warning Systems, Process Automation and Intelligent Personal Assistant because of their high accuracy and good generalization capability. Multilayer perceptrons (MLP) and radial basis functions (RBF) are the most commonly used ANN though interest in probabilistic neural networks (PNN) is also increasing recently . The main difference among these methods lies in the ways of partitioning the data into different classes.
Though in the area of analog electronic circuit condition monitoring RBF was experimented . It is important that the others type be experimented for comparing the performance of three types of the ANN and for finding the best performance of soft fault detection in analog electronic circuit.
The development of a diagnostic system using ANN consists of the following main steps: definition of faults of interest, selection of an optimal set of measurements, feature extraction (generation of circuit under test signatures), the choice of type and topology of the ANN, training and testing the ANN. In the diagnostic process of analog electronic circuit, the measured circuit response is compared with the signatures corresponding to each potential fault condition stored in the dictionary. By a fault in analog electronic circuit we mean any change in the element value which can cause a failure of the circuit.
In this research, collecting the references of diagnostic system using ANN is the first step. By collecting the references we can compare the results of research that have been done. The next step is designing and implementing the diagnostic system using three types of the ANN. Testing the system for each type of the ANN is very important for comparing the system performance. Performance comparison of the system is indicated by percentage of test success for each type of the ANN.
The aim of this research is to develop the ANN and dictionary approach for soft faults location in electronic circuits at the component level using three types of the ANN and to compare the performance of the three types of artificial neural network (ANN). The best performance of soft fault detection in analog electronic circuit using three types of the ANN will be found by evaluating experiment results. The result from this research can be proposed and implemented in the electronic industry for increasing product quality and decreasing the possibility of production failure due to faulty electronic component and circuit.
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